MNE3127 - Electron Microscopy | ||||||||||
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| * The offering term is subject to change without prior notice | ||||||||||
Course Aims | ||||||||||
This course introduces the theoretical and practical aspects of electron-beam microanalysis based on modern electron microscopy techniques, including Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and X-Ray Energy Dispersive Spectroscopy (XEDS). The lectures cover vacuum system and instrumentations, basic electron optics, electron-beam and specimen interactions, electron diffraction, image formation and interpretation, generation of X-rays, qualitative X-ray microanalysis. The theoretical understanding gained by students will help them understand and interpret experimental data as well as perform electron microscopy experiments. Hands-on experience is also emphasized, which includes sample preparation techniques and use electron microscope(s). | ||||||||||
Assessment (Indicative only, please check the detailed course information) | ||||||||||
Continuous Assessment: 60% | ||||||||||
Examination: 40% | ||||||||||
Examination Duration: 2 hours | ||||||||||
For a student to pass the course, at least 30% of the maximum mark for both coursework and examination should be obtained. | ||||||||||
Detailed Course Information | ||||||||||
| MNE3127.pdf | ||||||||||
